Infineon CoolMOS™ N-Channel MOSFET, 8.4 A, 600 V, 3-Pin TO-220 FP IPAN60R800CEXKSA1
- RS Stock No.:
- 217-2499
- Mfr. Part No.:
- IPAN60R800CEXKSA1
- Brand:
- Infineon
Bulk discount available
Subtotal (1 pack of 20 units)*
£10.90
(exc. VAT)
£13.08
(inc. VAT)
FREE delivery for orders over £50.00
Temporarily out of stock
- Shipping from 10 July 2026
Need more? Click ‘Check delivery dates’ to find extra stock and lead times.
Units | Per unit | Per Pack* |
---|---|---|
20 - 80 | £0.545 | £10.90 |
100 - 180 | £0.42 | £8.40 |
200 - 480 | £0.393 | £7.86 |
500 - 980 | £0.365 | £7.30 |
1000 + | £0.338 | £6.76 |
*price indicative
- RS Stock No.:
- 217-2499
- Mfr. Part No.:
- IPAN60R800CEXKSA1
- Brand:
- Infineon
Specifications
Technical Reference
Legislation and Compliance
Product Details
Find similar products by selecting one or more attributes.
Select all | Attribute | Value |
---|---|---|
Brand | Infineon | |
Channel Type | N | |
Maximum Continuous Drain Current | 8.4 A | |
Maximum Drain Source Voltage | 600 V | |
Package Type | TO-220 FP | |
Series | CoolMOS™ | |
Mounting Type | Through Hole | |
Pin Count | 3 | |
Maximum Drain Source Resistance | 800 mO | |
Maximum Gate Threshold Voltage | 3.5V | |
Number of Elements per Chip | 1 | |
Select all | ||
---|---|---|
Brand Infineon | ||
Channel Type N | ||
Maximum Continuous Drain Current 8.4 A | ||
Maximum Drain Source Voltage 600 V | ||
Package Type TO-220 FP | ||
Series CoolMOS™ | ||
Mounting Type Through Hole | ||
Pin Count 3 | ||
Maximum Drain Source Resistance 800 mO | ||
Maximum Gate Threshold Voltage 3.5V | ||
Number of Elements per Chip 1 | ||
The Infineon CoolMOS™ CE is suitable for hard and soft switching applications and as modern superjunction, it delivers low conduction and switching losses improving efficiency and ultimately reduces power consumption. 600V, 650V and 700V CoolMOS™ CE combine the optimal R DS(on) and package offering suitable in low power chargers for mobile phones and tablets.
Narrow margins between typical and max R DS(on)
Reduced energy stored in output capacitance (E oss)
Good body diode ruggedness and reduced reverse recovery charge (Q rr)
Optimized integrated R g
Reduced energy stored in output capacitance (E oss)
Good body diode ruggedness and reduced reverse recovery charge (Q rr)
Optimized integrated R g
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