TE Connectivity Banana Connector

The TE Connectivity Test probe 130 is an advanced solution designed for seamless integration into your printed circuit board setups. This exceptional component delivers reliable connections and is engineered for high performance in power and signal applications. Crafted with gold-plated contact mating areas, it offers superior electrical conductivity while ensuring overall durability and longevity. With its board mount connector system, the test probe is tailored to provide robust connectivity in various environments. Its compact profile height from the PCB contributes to versatile design possibilities, making it ideal for compact electronic assemblies. The combination of thoughtful design and top-grade materials ensures this product meets the stringent compliance standards demanded by today's industries.

Connector system designed specifically for cable-to-board applications
Constructed from durable nylon GF for long-lasting performance
Features a side entry for efficient test probe hole location
Compatible with a range of associated parts for versatile configurations
Capable of withstanding operating temperatures from -55 to 85 °C
Wave solder capable, enabling efficient assembly processes
Low halogen content adheres to modern safety and environmental standards
Accommodates a maximum contact current rating of 4.75 A