TE Connectivity NEOHM SMA-Q 41.2 Ω, 0102 Thin Film Surface Mount Fixed Resistor 1 % Surface 0.3 W - SMA-Q0102FTDL41R2

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Subtotal (1 reel of 3000 units)*

£192.00

(exc. VAT)

£231.00

(inc. VAT)

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Units
Per unit
Per Reel*
3000 - 12000£0.064£192.00
15000 +£0.063£189.00

*price indicative

RS Stock No.:
590-510
Mfr. Part No.:
SMA-Q0102FTDL41R2
Brand:
TE Connectivity
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Brand

TE Connectivity

Resistance

41.2Ω

Product Type

Surface Mount Fixed Resistor

Technology

Thin Film

Resistor Type

Metal Film Precision

Package/Case

0102

Packaging

Tape & Reel

Tolerance

1 %

Power Rating

0.3W

Voltage

20V

Mount Type

Surface

Temperature Coefficient

±50 ppm/°C

Automotive Standard

AEC-Q200

Minimum Operating Temperature

-55°C

Series

NEOHM SMA-Q

Maximum Operating Temperature

155°C

Termination Style

Melf 0102

Standards/Approvals

RoHS

Width

1.1mm

Length

2.2mm

COO (Country of Origin):
TW
The TE Connectivity Metal film precision MELF resistor is designed with a robust SMD-enabled structure, ensuring maximum reliability and precision in your applications. Engineered to withstand the demands of both automotive and industrial sectors, this resistor boasts an impressive combination of tight tolerance and exceptionally low temperature coefficient of resistance (TCR). The resistor's enhanced coating provides improved humidity protection, making it a dependable choice for critical environments. Its lead-free and RoHS-compliant construction underscores a commitment to sustainability, while the various available sizes and power ratings allow for flexible integration into diverse electronic systems. The unique attributes of It contribute to its AEC-Q200 qualification, ensuring it meets stringent automotive standards in reliability and performance.

Exceptional moisture protection for increased durability

Lead free SMD enabled design for easy integration

AEC Q200 qualified for automotive reliability

Ultra low TCR ensures consistent performance across temperatures

Wide resistance range enables versatile applications

Optimal stability for demanding measurement and testing conditions

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