The ON Semiconductor an evaluation board for the NIS5020 eFuse within the Strata Development Environment and offers a programmable trip current limit, a programmable slew rate, and thermal protection features, the evaluation board provides an on board short circuit load to test the short circuit protection features of the eFuse, this evaluation board must be used with Strata to control the eFuse and monitor telemetry such as input/output voltage, input/output current, and temperature.

Vin Range from 9.2V to 18V
Multiple overload current options
2 independently controlled eFuses that can be placed in parallel
Programmable slew rate