STMicroelectronics M24C64-FMH6TG, 64kbit Serial EEPROM Memory, 450ns 5-Pin UFDFPN Serial-I2C
- RS Stock No.:
- 239-6328P
- Mfr. Part No.:
- M24C64-FMH6TG
- Brand:
- STMicroelectronics
Subtotal 15 units (supplied on a continuous strip)*
£2.85
(exc. VAT)
£3.45
(inc. VAT)
Stock information currently inaccessible
Units | Per unit |
|---|---|
| 15 + | £0.19 |
*price indicative
- RS Stock No.:
- 239-6328P
- Mfr. Part No.:
- M24C64-FMH6TG
- Brand:
- STMicroelectronics
Specifications
Technical Reference
Legislation and Compliance
Product Details
Find similar products by selecting one or more attributes.
Select all | Attribute | Value |
|---|---|---|
| Brand | STMicroelectronics | |
| Memory Size | 64kbit | |
| Interface Type | Serial-I2C | |
| Package Type | UFDFPN | |
| Mounting Type | Surface Mount | |
| Pin Count | 5 | |
| Organisation | 8K x 8 bit | |
| Minimum Operating Supply Voltage | 1.7 V | |
| Maximum Operating Supply Voltage | 5.5 V | |
| Programming Voltage | 1.7 → 5.5V | |
| Number of Bits per Word | 8bit | |
| Dimensions | 1.7 x 1.4 x 0.55mm | |
| Automotive Standard | AEC-Q100 | |
| Maximum Operating Temperature | +85 °C | |
| Minimum Operating Temperature | -40 °C | |
| Data Retention | 200yr | |
| Number of Words | 8k | |
| Maximum Random Access Time | 450ns | |
Select all | ||
|---|---|---|
Brand STMicroelectronics | ||
Memory Size 64kbit | ||
Interface Type Serial-I2C | ||
Package Type UFDFPN | ||
Mounting Type Surface Mount | ||
Pin Count 5 | ||
Organisation 8K x 8 bit | ||
Minimum Operating Supply Voltage 1.7 V | ||
Maximum Operating Supply Voltage 5.5 V | ||
Programming Voltage 1.7 → 5.5V | ||
Number of Bits per Word 8bit | ||
Dimensions 1.7 x 1.4 x 0.55mm | ||
Automotive Standard AEC-Q100 | ||
Maximum Operating Temperature +85 °C | ||
Minimum Operating Temperature -40 °C | ||
Data Retention 200yr | ||
Number of Words 8k | ||
Maximum Random Access Time 450ns | ||
64-Kbit serial I²C bus EEPROM
Description
The M24C64 is a 64-Kbit I²C-compatible EEPROM (electrically erasable programmable memory) organized as 8K x 8 bits.
Over an ambient temperature range of -40 °C / +85 °C, the M24C64-W can operate with a supply voltage from 2.5 V to 5.5 V, the M24C64-R can operate with a supply voltage from 1.8 V to 5.5 V, and the M24C64-F and M24C64-DF can operate with a supply voltage from 1.7 V to 5.5 V ( the M24C64-F can also operate down to 1.6 V, under some restricting conditions).
The M24C64-D offers an additional page, named the identification page (32 byte). The identification page can be used to store sensitive application parameters which can be (later) permanently locked in read-only mode.
Over an ambient temperature range of -40 °C / +85 °C, the M24C64-W can operate with a supply voltage from 2.5 V to 5.5 V, the M24C64-R can operate with a supply voltage from 1.8 V to 5.5 V, and the M24C64-F and M24C64-DF can operate with a supply voltage from 1.7 V to 5.5 V ( the M24C64-F can also operate down to 1.6 V, under some restricting conditions).
The M24C64-D offers an additional page, named the identification page (32 byte). The identification page can be used to store sensitive application parameters which can be (later) permanently locked in read-only mode.
Features
Compatible with following I²C bus modes:
1 MHz
400 kHz
100 kHz
Memory array:
64 Kbit (8 Kbyte) of EEPROM
Page size: 32 byte
Additional Write lockable page (M24C64-D order codes)
Single supply voltage:
1.7 V to 5.5 V over –40 °C / +85 °C
1.6 V to 5.5 V over 0 °C / +85 °C
Write:
Byte write within 5 ms
Page write within 5 ms
1 MHz
400 kHz
100 kHz
Memory array:
64 Kbit (8 Kbyte) of EEPROM
Page size: 32 byte
Additional Write lockable page (M24C64-D order codes)
Single supply voltage:
1.7 V to 5.5 V over –40 °C / +85 °C
1.6 V to 5.5 V over 0 °C / +85 °C
Write:
Byte write within 5 ms
Page write within 5 ms
Random and sequential read modes
Write protect of the whole memory array
Enhanced ESD/latch-Up protection
More than 4 million write cycles
More than 200-years data retention
Packages:
SO8N (ECOPACK2)
TSSOP8 (ECOPACK2)
UFDFPN (ECOPACK2)
WLCSP (ECOPACK2)
Unsawn wafer (each die is tested)