Sick Fibre Optic Sensor 1050 mm

For any application oriented sensor solution, a suitable fibber optic cable must be chosen. At SICK, the broad range of fibber optic cables made from plastic and glass fibbers permits optimal automation solutions. This applies in particular to tasks for which the fibber optic cable requires application-specific adaption, where flexible cable installation is crucial, where high temperatures prevail, or a particular material compatibility is important. While the fibbers of plastic fibber optic cables are characterized, among other things, by the smallest of bend radii and maximum flexibility, and can also be shortened to any length, the glass fibber optic cables are more chemically resistant and suitable for a higher temperature range.

The wide variety of end sleeve options or individual special sleeves enable virtually any installation possibility. Depending on the application, the fibber optic cable's protective cladding can be made from plastic, metal, or Teflon for exposure to aggressive chemicals.

Very large selection of plastic and glass fibber-optic cables.
Fibber-optic cables resistant to chemicals and high temperature
Threaded and smooth sleeves, bands of light (array), 90° reflection versions available
Focused optics
Proximity and through-beam versions available
Plastic , protective metal or Teflon sheathing available

Very large selection of fibber-optic cables with plastic and glass fibers, giving users more application flexibility
Resistant to damage caused by mechanical and chemical stress, as well as high temperatures
Standard and customer-specific types
Simple installation saves time
For detection of objects, surfaces, leading edges, and fluid levels

Factory automation
Handling and assembly technology: Quality and position monitoring on conveyor belts
Handling and assembly technology: Safe detection in tight spaces, without interference
Solar: Double layer detection of solar wafers in wafer production

Health care manufacturing: Identification of rack codes and level measurement of test tubes in the Single Lane Analyser
Semiconductor: Quick and accurate wafer detection