Professional IC test clips with nickel silver alloy contacts in a high grade thermoplastic moulding
Features are wiping action ’duck bill’ contacts for optimum electrical reliability, heavy duty spring for firm uniform contact pressure, and an open nose design that permits probe access directly at the Dual-In-Line (DIP) package pins.
The contact comb fits between DIP package leads to eliminate electrical shorting hazards
The test clips can be used with standard DIP packages up to 14, 16, 20, 24, 28 and 40 pins
Body material High Grade Thermoplastic, Gold plating
Contact Material Nickel Silver Alloy
Operating Temperature -55°C to +165°C
Flammability UL 94 V-0
Current rating 2A

Get a grip on your application with this IC test clip from 3M. Its spring-loaded contacts clamp firmly onto the legs of an IC, allowing signals to pass seamlessly between test equipment and an attached circuit. The open-nose design gives you probe access directly at the DIP pins, for a precision connection.

• Gold-plated body material provides effective resistance to corrosion
• Operating temperature range of -55°C to +165°C for use in challenging environments
• Contact comb fits between DIP package leads, so there's no risk of electrical shorting

• Electronics troubleshooting and repair
• Production testing
• Prototyping experimentation

DIP units consist of two rows of pins arranged in a straight line, with the pins on either side of the package spaced equidistantly. This provides a compact and reliable solution for connecting ICs to a circuit board.